Why You're Here: Ethics for the Real World, John G. Stackhouse, Jr., Oxford University Press, 2018 (ISBN 978-0-1906-3674-6), viii + 320 pp., pb £12.99

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Bibliographic Details
Main Author: Puen, Stephanie Ann (Author)
Format: Electronic Review
Language:English
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Published: Wiley-Blackwell 2018
In: Reviews in religion and theology
Year: 2018, Volume: 25, Issue: 4, Pages: 766-768
Review of:Why you're here (New York : Oxford University Press, 2017) (Puen, Stephanie Ann)
Further subjects:B Book review
Online Access: Volltext (lizenzpflichtig)
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Description
ISSN:1467-9418
Contains:Enthalten in: Reviews in religion and theology
Persistent identifiers:DOI: 10.1111/rirt.13411